Jos Maas steps down as CEO of Nearfield Instruments, Hamed Sadeghian appointed as new CEO - Everything About Metrology
Nearfield Instruments (NFI) and VHE Industrial automation (VHE) have signed a Memorandum of Understanding - Everything About Metrology
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Nearfield Instruments - Quadra - High Throughput Scanning Probe Microscopy - Twisted
Nearfield Instruments - Quadra - High Throughput Scanning Probe Microscopy - Twisted
Nearfield Instruments - Quadra - High Throughput Scanning Probe Microscopy - Twisted
Nearfield Instruments - Quadra - High Throughput Scanning Probe Microscopy - Twisted
Nearfield Instruments: world leader in metrology | TNO
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High-speed data acquisition and transport for Nearfield Instruments - Technolution Advance
Nearfield Instruments - Quadra - High Throughput Scanning Probe Microscopy - Twisted
High-speed data acquisition and transport for Nearfield Instruments - Technolution Advance
Nearfield Instruments B.V. | LinkedIn
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First sale puts Nearfield Instruments on the path to maturity – Bits&Chips
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